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Surface Analysis - Innovations and Solutions for Industry

Thursday 12th October


09.00 Registration opens in the atrium  
10.00 Introduction and welcome:  
SESSION 1 | Chair: Mark Baker  
10.10 Standards in surface chemical analysis
Charles Clifford, National Physical Laboratory, UK
10.50 Surface analysis in the nuclear industry
Dr Paul Roussel, AWE, UK
11.10 Latest Developments in 2D and 3D TOF-SIMS Analysis
Matthias Kleine-Boymann, ION-TOF GmbH , Germany
11.30 - break -  
11.50 ToF-SIMS and industrial applications
Dr David Scurr, University of Nottingham, UK
12.10 XPS for surface and thin film characterisation
Dr Chris Blomfield, Kratos Analytical Ltd, UK
SESSION 2 | In the exhibition hall:  
12.30 Lunch Break | POSTER SESSION
A poster prize will be awarded at 13.30 for the best poster.
13.35 Networking | Exhibition Session
Delegates are encouraged to visit the Vacuum Expo exhibitors.
SESSION 3 | Chair: Alex Shard  
Near-ambient pressure instrumentation: New directions for Surface Analysis with XPS and related core-level spectroscopies
Prof Sven Schroeder, University of Leeds, UK
14.40 Vibrational sum-frequency spectroscopy applied to corrosion inhibition.
Dr Andrew Thomas, University of Manchester, UK
15.00 A measured approach to organic surfaces
Dr Alex Shard, National Physical Laboratory, UK
15.20 Argon cluster XPS depth profiling of metal oxide thin films
Dr Mark Baker, University of Surrey, UK
15.40 Meeting materials challenges with correlative analysis
Dr Adam Bushell, Thermo Fisher Scientific, UK
16.00 Networking session.  
16:30 End of meeting.  


The 2017 Conference and Industry Programme, run by Enlighten Meetings with its partners, covers application and technology advances, innovations and emerging technologies.

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Dr Mark Baker (Chair)
Reader in Surface Science & Engineering, University of Surrey

Dr Alex Shard
Principal Rsearch Scientist, Surface and NanoAnalysis, National Physical Laboratory

Ian Owen
Scanwel Ltd