Armstrong Optical on Stand C44

Armstrong Optical to show range of optical metrology systems and optical components and assemblies

Metrology systems being demonstrated will include the µPhase 2 high resolution phase measuring interferometer and the smartgage wavefront sensor from Fisba Optik; the MicroPhase 3D surface profiling system installed on a Zeiss AxioImager A1M microscope from PhaseView; the CHRocodile non-contact sensors and Nemesis PV non-contact 3D surface profiling and thickness measurement system from Precitec Optronik; the Interfire II infrared interferometer from Precision Solutions; standard ISO test charts and custom reticle service from Precision Optical Imaging; the new LSV-series long range non-contact vibrometer system from SIOS Meßtechnik; a novel Dual-Speed-Mode linear stage from Feinmess.

A variety of optical components and assemblies will be shown, ranging from glass wafers, lenses and prisms for UV, visible and NIR wavebands through to aspheric diffractive lenses, windows and domes for the LWIR waveband.

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